Liu S - Search Results

1

Optical, Structural, and Synchrotron X-ray Absorption Studies for GaN Thin Films Grown on Si by Molecular Beam Epitaxy.

Feng ZC, Liu J, Xie D, Nafisa MT, Zhang C, Wan L, Jiang B, Lin HH, Qiu ZR, Lu W, Klein B, Ferguson IT, Liu S. Feng ZC, et al. Among authors: liu j, liu s. Materials (Basel). 2024 Jun 14;17(12):2921. doi: 10.3390/ma17122921. Materials (Basel). 2024. PMID: 38930290 Free PMC article.

2

Improved model-based infrared reflectrometry for measuring deep trench structures.

Zhang C, Liu S, Shi T, Tang Z. Zhang C, et al. Among authors: liu s. J Opt Soc Am A Opt Image Sci Vis. 2009 Nov;26(11):2327-35. doi: 10.1364/JOSAA.26.002327. J Opt Soc Am A Opt Image Sci Vis. 2009. PMID: 19884928

3

Fitting-determined formulation of effective medium approximation for 3D trench structures in model-based infrared reflectrometry.

Zhang C, Liu S, Shi T, Tang Z. Zhang C, et al. Among authors: liu s. J Opt Soc Am A Opt Image Sci Vis. 2011 Feb 1;28(2):263-71. doi: 10.1364/JOSAA.28.000263. J Opt Soc Am A Opt Image Sci Vis. 2011. PMID: 21293531

4

Development of a spectroscopic Mueller matrix imaging ellipsometer for nanostructure metrology.

Chen X, Du W, Yuan K, Chen J, Jiang H, Zhang C, Liu S. Chen X, et al. Among authors: liu s. Rev Sci Instrum. 2016 May;87(5):053707. doi: 10.1063/1.4952385. Rev Sci Instrum. 2016. PMID: 27250435

5

Ultra Uniform Pb_0.865La_0.09(Zr_0.65Ti_0.35)O₃ Thin Films with Tunable Optical Properties Fabricated via Pulsed Laser Deposition.

Jiang S, Huang C, Gu H, Liu S, Zhu S, Li MY, Yao L, Wu Y, Zhang G. Jiang S, et al. Among authors: liu s. Materials (Basel). 2018 Mar 29;11(4):525. doi: 10.3390/ma11040525. Materials (Basel). 2018. PMID: 29596398 Free PMC article.

6

Investigations of Optical Functions and Optical Transitions of 2D Semiconductors by Spectroscopic Ellipsometry and DFT.

Gu H, Guo Z, Huang L, Fang M, Liu S. Gu H, et al. Among authors: liu s. Nanomaterials (Basel). 2023 Jan 1;13(1):196. doi: 10.3390/nano13010196. Nanomaterials (Basel). 2023. PMID: 36616106 Free PMC article.

7

Effects of Substrate Temperature on Optical, Structural, and Surface Properties of Metal-Organic Vapor Phase Epitaxy-Grown MgZnO Films.

Liu J, Xie D, Feng ZC, Nafisa MT, Wan L, Qiu ZR, Wuu DS, Zhang C, Yiin J, Lin HH, Lu W, Klein B, Ferguson IT, Liu S. Liu J, et al. Among authors: liu s. Nanomaterials (Basel). 2024 Dec 5;14(23):1957. doi: 10.3390/nano14231957. Nanomaterials (Basel). 2024. PMID: 39683345 Free PMC article.

8

Improved measurement accuracy in optical scatterometry using correction-based library search.

Chen X, Liu S, Zhang C, Jiang H. Chen X, et al. Among authors: liu s. Appl Opt. 2013 Sep 20;52(27):6726-34. doi: 10.1364/AO.52.006726. Appl Opt. 2013. PMID: 24085171

9

Robust solution to the inverse problem in optical scatterometry.

Zhu J, Liu S, Chen X, Zhang C, Jiang H. Zhu J, et al. Among authors: liu s. Opt Express. 2014 Sep 8;22(18):22031-42. doi: 10.1364/OE.22.022031. Opt Express. 2014. PMID: 25321577 Free article.

10

Efficient representation of mask transmittance functions for vectorial lithography simulations.

Zhou X, Zhang C, Jiang H, Wei H, Liu S. Zhou X, et al. Among authors: liu s. J Opt Soc Am A Opt Image Sci Vis. 2014 Dec 1;31(12):B10-8. doi: 10.1364/JOSAA.31.000B10. J Opt Soc Am A Opt Image Sci Vis. 2014. PMID: 25606775

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