Majkowycz K - Search Results

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The Influence of Etching Method on the Occurrence of Defect Levels in III-V and II-VI Materials.

Majkowycz K, Murawski K, Kopytko M, Nowakowski-Szkudlarek K, Witkowska-Baran M, Martyniuk P. Majkowycz K, et al. Nanomaterials (Basel). 2024 Oct 9;14(19):1612. doi: 10.3390/nano14191612. Nanomaterials (Basel). 2024. PMID: 39404339 Free PMC article.

Optical Characterization of the Interband Cascade LWIR Detectors with Type-II InAs/InAsSb Superlattice Absorber.

Murawski K, Majkowycz K, Kopytko M, Manyk T, Dąbrowski K, Seredyński B, Kubiszyn Ł, Martyniuk P. Murawski K, et al. Among authors: majkowycz k. Nanomaterials (Basel). 2024 Aug 26;14(17):1393. doi: 10.3390/nano14171393. Nanomaterials (Basel). 2024. PMID: 39269055 Free PMC article.

Defect Analysis in a Long-Wave Infrared HgCdTe Auger-Suppressed Photodiode.

Kopytko M, Majkowycz K, Murawski K, Sobieski J, Gawron W, Martyniuk P. Kopytko M, et al. Among authors: majkowycz k. Sensors (Basel). 2024 Jun 1;24(11):3566. doi: 10.3390/s24113566. Sensors (Basel). 2024. PMID: 38894357 Free PMC article.

Non-Equilibrium Long-Wave Infrared HgCdTe Photodiodes: How the Exclusion and Extraction Junctions Work Separately.

Kopytko M, Majkowycz K, Sobieski J, Manyk T, Gawron W. Kopytko M, et al. Among authors: majkowycz k. Materials (Basel). 2024 May 25;17(11):2551. doi: 10.3390/ma17112551. Materials (Basel). 2024. PMID: 38893816 Free PMC article.

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