Exploring sensitive skin to design reliable measurements.
Rengot J, Stuhlmann D, Meyer I, Chevrot N, Maire ML, Chamla J, Gierschendorf J, Cherel M, Prestat-Marquis E.
Rengot J, et al. Among authors: stuhlmann d.
Skin Res Technol. 2023 Oct;29(10):e13449. doi: 10.1111/srt.13449.
Skin Res Technol. 2023.
PMID: 37881046
Free PMC article.
No abstract available.