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Page 1
Spintronic terahertz emitters with integrated metallic terahertz cavities.
Mičica M, Wright A, Koleják P, Lezier G, Postava K, Hawecker J, De Vetter A, Tignon J, Mangeney J, Jaffres H, Lebrun R, Tiercelin N, Vanwolleghem M, Dhillon S. Mičica M, et al. Among authors: vanwolleghem m. Nanophotonics. 2024 Mar 1;13(10):1899-1907. doi: 10.1515/nanoph-2023-0807. eCollection 2024 Apr. Nanophotonics. 2024. PMID: 39635616 Free PMC article.
Optical damage thresholds of single-mode fiber-tip spintronic terahertz emitters.
Paries F, Selz F, Santos CN, Lampin JF, Koleják P, Lezier G, Troadec D, Tiercelin N, Vanwolleghem M, Addda A, Kampfrath T, Seifert TS, Freymann GV, Molter D. Paries F, et al. Among authors: vanwolleghem m. Opt Express. 2024 Jul 1;32(14):24826-24838. doi: 10.1364/OE.525747. Opt Express. 2024. PMID: 39538912 Free article.
Fiber-tip spintronic terahertz emitters.
Paries F, Tiercelin N, Lezier G, Vanwolleghem M, Selz F, Syskaki MA, Kammerbauer F, Jakob G, Jourdan M, Kläui M, Kaspar Z, Kampfrath T, Seifert TS, von Freymann G, Molter D. Paries F, et al. Among authors: vanwolleghem m. Opt Express. 2023 Sep 11;31(19):30884-30893. doi: 10.1364/OE.494623. Opt Express. 2023. PMID: 37710621 Free article.
High-resolution THz gain measurements in optically pumped ammonia.
Mičica M, Eliet S, Vanwolleghem M, Motiyenko R, Pienkina A, Margulès L, Postava K, Pištora J, Lampin JF. Mičica M, et al. Among authors: vanwolleghem m. Opt Express. 2018 Aug 6;26(16):21242-21248. doi: 10.1364/OE.26.021242. Opt Express. 2018. PMID: 30119428 Free article.
Short bends using curved mirrors in silicon waveguides for terahertz waves.
Verstuyft M, Akiki E, Vanwolleghem M, Ducournau G, Lampin JF, Walter B, Bavedila F, Lebouvier É, Faucher M, Kuyken B. Verstuyft M, et al. Among authors: vanwolleghem m. Opt Express. 2022 Feb 28;30(5):6656-6670. doi: 10.1364/OE.447268. Opt Express. 2022. PMID: 35299446 Free article.
Monitoring of food spoilage by high resolution THz analysis.
Hindle F , Kuuliala L , Mouelhi M , Cuisset A , Bray C , Vanwolleghem M , Devlieghere F , Mouret G , Bocquet R . Hindle F , et al. Among authors: vanwolleghem m. Analyst. 2018 Nov 5;143(22):5536-5544. doi: 10.1039/c8an01180j. Analyst. 2018. PMID: 30298153
13 results