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Surface Depth Analysis of Chemical Changes in Random Copolymer Thin Films Composed of Hydrophilic and Hydrophobic Silicon-Based Monomers Induced by Plasma Treatment as Studied by Hard X-ray Photoelectron Spectroscopy and Neutron Reflectivity Measurements.
Yamamoto K, Imai T, Kawai A, Ito E, Miyazaki T, Miyata N, Yamada NL, Seto H, Aoki H. Yamamoto K, et al. Among authors: ito e. ACS Appl Mater Interfaces. 2024 Dec 4;16(48):66782-66791. doi: 10.1021/acsami.4c17393. Epub 2024 Nov 21. ACS Appl Mater Interfaces. 2024. PMID: 39569677
1,387 results