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8,886 results

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Page 1
Extension of Kelvin's equation to dipolar colloids.
Joshi K, Biswal SL. Joshi K, et al. Proc Natl Acad Sci U S A. 2022 Mar 22;119(12):e2117971119. doi: 10.1073/pnas.2117971119. Epub 2022 Mar 14. Proc Natl Acad Sci U S A. 2022. PMID: 35286192 Free PMC article.
Additionally, we demonstrate the applicability of Kelvin's equation to this field-driven system. In principle, this appears to be in conflict with macroscopic thermodynamic assumptions due to the nonequilibrium and discrete nature of this colloidal system. ...
Additionally, we demonstrate the applicability of Kelvin's equation to this field-driven system. In principle, this appears to be in …
Kelvin probe force microscopy for material characterization.
Glatzel T, Gysin U, Meyer E. Glatzel T, et al. Microscopy (Oxf). 2022 Feb 18;71(Supplement_1):i165-i173. doi: 10.1093/jmicro/dfab040. Microscopy (Oxf). 2022. PMID: 35275187
Kelvin probe force microscopy is a scanning probe method for imaging the surface potential by atomic force microscopy. ...
Kelvin probe force microscopy is a scanning probe method for imaging the surface potential by atomic force microscopy. ...
Kelvin Probe Microscopy Investigation of Poly-Octylthiophene Aggregates.
Bermejo J, Colchero J, Palacios-Lidon E. Bermejo J, et al. Materials (Basel). 2022 Feb 6;15(3):1212. doi: 10.3390/ma15031212. Materials (Basel). 2022. PMID: 35161156 Free PMC article.
We characterize the electronic ground state using Kelvin probe microscopy. This allows us to resolve a rich variety of surface potential regions that emerge over the different polymer structures. ...
We characterize the electronic ground state using Kelvin probe microscopy. This allows us to resolve a rich variety of surface potent …
Pulsed Force Kelvin Probe Force Microscopy-A New Type of Kelvin Probe Force Microscopy under Ambient Conditions.
Zahmatkeshsaredorahi A, Jakob DS, Xu XG. Zahmatkeshsaredorahi A, et al. J Phys Chem C Nanomater Interfaces. 2024 Jun 8;128(24):9813-9827. doi: 10.1021/acs.jpcc.4c01461. eCollection 2024 Jun 20. J Phys Chem C Nanomater Interfaces. 2024. PMID: 38919728 Free PMC article. Review.
Kelvin probe force microscopy (KPFM) is an increasingly popular scanning probe microscopy technique used for nanoscale imaging of surface potential for various materials, such as metals, semiconductors, biological samples, and photovoltaics, to reveal their surface work fu
Kelvin probe force microscopy (KPFM) is an increasingly popular scanning probe microscopy technique used for nanoscale imaging of sur
Kelvin spray ionization.
Özdemir A, Lin JL, Gillig KJ, Chen CH. Özdemir A, et al. Analyst. 2013 Nov 21;138(22):6913-23. doi: 10.1039/c3an01072d. Analyst. 2013. PMID: 24080942
The idea behind this ionization source comes from the Kelvin water dropper. The source employs one or two syringes, two pneumatic sprays operated over a range of flow rates (0.15-15 muL min(-1)) and gas pressures (0-150 psi), and two double layered metal screens for ion fo …
The idea behind this ionization source comes from the Kelvin water dropper. The source employs one or two syringes, two pneumatic spr …
Low uncertainty Boltzmann constant determinations and the kelvin redefinition.
Fischer J. Fischer J. Philos Trans A Math Phys Eng Sci. 2016 Mar 28;374(2064):20150038. doi: 10.1098/rsta.2015.0038. Philos Trans A Math Phys Eng Sci. 2016. PMID: 26903108 Review.
The effect of the new definition of the kelvin referenced to the value of the Boltzmann constant k is that the kelvin is equal to the change of thermodynamic temperature T that results in a change of thermal energy kT by 1.380 6510(-23) J. ...The consequences of the …
The effect of the new definition of the kelvin referenced to the value of the Boltzmann constant k is that the kelvin is equal …
Pulsed Force Kelvin Probe Force Microscopy.
Jakob DS, Wang H, Xu XG. Jakob DS, et al. ACS Nano. 2020 Apr 28;14(4):4839-4848. doi: 10.1021/acsnano.0c00767. Epub 2020 Apr 16. ACS Nano. 2020. PMID: 32283008
Measurement of the contact potential difference (CPD) and work functions of materials are important in analyzing their electronic structures and surface residual charges. Kelvin probe force microscopy (KPFM), an imaging technique of atomic force microscopy, has been widely …
Measurement of the contact potential difference (CPD) and work functions of materials are important in analyzing their electronic structures …
The Kelvin equation.
Mitropoulos ACh. Mitropoulos ACh. J Colloid Interface Sci. 2008 Jan 15;317(2):643-8. doi: 10.1016/j.jcis.2007.10.001. Epub 2007 Oct 4. J Colloid Interface Sci. 2008. PMID: 17950748
The scattering data are analyzed with the indirect Fourier transformation technique and the results are compared with the predictions of the Kelvin equation. It is found that the Kelvin equation is obeyed by menisci with mean radius of curvature as low as 40 A. ...
The scattering data are analyzed with the indirect Fourier transformation technique and the results are compared with the predictions of the …
High-low Kelvin probe force spectroscopy for measuring the interface state density.
Izumi R, Miyazaki M, Li YJ, Sugawara Y. Izumi R, et al. Beilstein J Nanotechnol. 2023 Jan 31;14:175-189. doi: 10.3762/bjnano.14.18. eCollection 2023. Beilstein J Nanotechnol. 2023. PMID: 36761682 Free PMC article.
The recently proposed high-low Kelvin probe force microscopy (KPFM) enables evaluation of the effects of semiconductor interface states with high spatial resolution using high and low AC bias frequencies compared with the cutoff frequency of the carrier transfer between th …
The recently proposed high-low Kelvin probe force microscopy (KPFM) enables evaluation of the effects of semiconductor interface stat …
A sub-Kelvin cryogen-free EPR system.
Melhuish SJ, Stott C, Ariciu AM, Martinis L, McCulloch M, Piccirillo L, Collison D, Tuna F, Winpenny R. Melhuish SJ, et al. J Magn Reson. 2017 Sep;282:83-88. doi: 10.1016/j.jmr.2017.07.007. Epub 2017 Jul 20. J Magn Reson. 2017. PMID: 28783525 Free article.
A description of the cryogenic and RF systems is given, along with the adaptations to the standard EPR experiment for operation at sub-Kelvin temperatures. As a first experiment, the EPR spectra of powdered Cr(12)O(9)(OH)(3) [Formula: see text] were measured. The sub-Ke
A description of the cryogenic and RF systems is given, along with the adaptations to the standard EPR experiment for operation at sub-Ke
8,886 results