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X-ray multibeam ptychography at up to 20 keV: nano-lithography enhances X-ray nano-imaging
Authors:
Tang Li,
Maik Kahnt,
Thomas L. Sheppard,
Runqing Yang,
Ken Vidar Falch,
Roman Zvagelsky,
Pablo Villanueva-Perez,
Martin Wegener,
Mikhail Lyubomirskiy
Abstract:
Non-destructive nano-imaging of the internal structure of solid matter is only feasible using hard X-rays due to their high penetration. The highest resolution images are achieved at synchrotron radiation sources (SRF), offering superior spectral brightness and enabling methods such as X-ray ptychography delivering single-digit nm resolution. However the resolution or field of view is ultimately c…
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Non-destructive nano-imaging of the internal structure of solid matter is only feasible using hard X-rays due to their high penetration. The highest resolution images are achieved at synchrotron radiation sources (SRF), offering superior spectral brightness and enabling methods such as X-ray ptychography delivering single-digit nm resolution. However the resolution or field of view is ultimately constrained by the available coherent flux. To address this, the beam's incoherent fraction can be exploited using multiple parallel beams in an approach known as X-ray multibeam ptychography (MBP). This expands the domain of X-ray ptychography to larger samples or more rapid measurements. Both qualities favor the study of complex composite or functional samples, such as catalysts, energy materials, or electronic devices. The challenges of performing ptychography at high energy and with many parallel beams must be overcome to extract the full advantages for extended samples while minimizing beam attenuation. Here, we report the application of MBP with up to 12 beams and at photon energies of 13 and 20 keV. We demonstrate performance for various samples: a Siemens star test pattern, a porous Ni/\ce{Al2O3} catalyst, a microchip, and gold nano-crystal clusters, exceeding the measurement limits of conventional hard X-ray ptychography without compromising image quality.
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Submitted 20 February, 2024; v1 submitted 19 February, 2024;
originally announced February 2024.
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3D Imaging of Magnetic Domains in Nd2Fe14B using Scanning Hard X-Ray Nanotomography
Authors:
Srutarshi Banerjee,
Doga Gursoy,
Junjing Deng,
Maik Kahnt,
Matthew Kramer,
Matthew Lynn,
Daniel Haskel,
Joerg Strempfer
Abstract:
Nanoscale structural and electronic heterogeneities are prevalent in condensed matter physics. Investigating these heterogeneities in three dimensions (3D) has become an important task for understanding their material properties. To provide a tool to unravel the connection between nanoscale heterogeneity and macroscopic emergent properties in magnetic materials, scanning transmission X-ray microsc…
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Nanoscale structural and electronic heterogeneities are prevalent in condensed matter physics. Investigating these heterogeneities in three dimensions (3D) has become an important task for understanding their material properties. To provide a tool to unravel the connection between nanoscale heterogeneity and macroscopic emergent properties in magnetic materials, scanning transmission X-ray microscopy (STXM) is combined with X-ray magnetic circular dichroism (XMCD). A vector tomography algorithm has been developed to reconstruct the full 3D magnetic vector field without any prior assumptions or knowledge. 2D STXM projections of single crystalline \ndfeb\ pillars are recorded for two different sample tilt angles while rotating around the vertical tomographic axis using $120$ nm X-ray beams with left and right circular polarization. Image alignment and iterative registration has been implemented, based on the 2D STXM projections for the two tilts. Dichroic projections obtained from difference images are used for the tomographic reconstruction to obtain the 3D magnetization distribution at the nanoscale.
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Submitted 21 January, 2024;
originally announced January 2024.
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A direct solver for the phase retrieval problem in ptychographic imaging
Authors:
Nada Sissouno,
Florian Boßmann,
Frank Filbir,
Mark Iwen,
Maik Kahnt,
Rayan Saab,
Christian Schroer,
Wolfgang zu Castell
Abstract:
Measurements achieved with ptychographic imaging are a special case of diffraction measurements. They are generated by illuminating small parts of a sample with, e.g., a focused X-ray beam. By shifting the sample, a set of far-field diffraction patterns of the whole sample are then obtained. From a mathematical point of view those measurements are the squared modulus of the windowed Fourier transf…
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Measurements achieved with ptychographic imaging are a special case of diffraction measurements. They are generated by illuminating small parts of a sample with, e.g., a focused X-ray beam. By shifting the sample, a set of far-field diffraction patterns of the whole sample are then obtained. From a mathematical point of view those measurements are the squared modulus of the windowed Fourier transform of the sample. Thus, we have a phase retrieval problem for local Fourier measurements. A direct solver for this problem was introduced by Iwen, Viswanathan and Wang in 2016 and improved by Iwen, Preskitt, Saab and Viswanathan in 2018. Motivated by the applied perspective of ptychographic imaging, we present a generalization of this method and compare the different versions in numerical experiments. The new method proposed herein turns out to be more stable, particularly in the case of missing data.
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Submitted 16 April, 2019;
originally announced April 2019.
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Ptychographic characterization of polymer compound refractive lenses manufactured by additive technology
Authors:
Mikhail Lyubomirskiy,
Frieder Koch,
Ksenia Abrashitova,
Vladimir Bessonov,
Natalia Kokareva,
Alexander Petrov,
Frank Seiboth,
Felix Wittwer,
Maik Kahnt,
Martin Seyrich Andrey Fedyanin,
Christian David,
Christian Schroer
Abstract:
The recent success in the development of high precision printing techniques allows one to manufacture free-standing polymer structures of high quality. Two-photon polymerization lithography is a mask-less technique with down to 100 μm resolution that provides full geometric freedom. It has recently been applied to the nanofabrication of X-ray compound refractive lenses (CRLs). In this article we r…
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The recent success in the development of high precision printing techniques allows one to manufacture free-standing polymer structures of high quality. Two-photon polymerization lithography is a mask-less technique with down to 100 μm resolution that provides full geometric freedom. It has recently been applied to the nanofabrication of X-ray compound refractive lenses (CRLs). In this article we report on the characterization of two sets of CRLs of different design produced by two-photon polymerization induced lithography.
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Submitted 14 December, 2018;
originally announced December 2018.
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Numerical approximation of multi-phase Penrose-Fife systems
Authors:
Carsten Gräser,
Max Kahnt,
Ralf Kornhuber
Abstract:
We consider a non-isothermal multi-phase field model. We subsequently discretize implicitly in time and with linear finite elements. The arising algebraic problem is formulated in two variables where one is the multi-phase field, and the other contains the inverse temperature field. We solve this saddle point problem numerically by a non-smooth Schur-Newton approach using truncated non-smooth Newt…
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We consider a non-isothermal multi-phase field model. We subsequently discretize implicitly in time and with linear finite elements. The arising algebraic problem is formulated in two variables where one is the multi-phase field, and the other contains the inverse temperature field. We solve this saddle point problem numerically by a non-smooth Schur-Newton approach using truncated non-smooth Newton multigrid methods. An application in grain growth as occurring in liquid phase crystallization of silicon is considered.
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Submitted 12 May, 2016;
originally announced May 2016.
