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Transistor Switches using Active Piezoelectric Gate Barriers
Authors:
Raj K. Jana,
Arvind Ajoy,
Gregory Snider,
Debdeep Jena
Abstract:
This work explores the consequences of introducing a piezoelectric gate barrier in a normal field-effect transistor. Because of the positive feedback of strain and piezoelectric charge, internal charge amplification occurs in such an electromechanical capacitor resulting in a negative capacitance. The first consequence of this amplification is a boost in the on-current of the transistor. As a seco…
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This work explores the consequences of introducing a piezoelectric gate barrier in a normal field-effect transistor. Because of the positive feedback of strain and piezoelectric charge, internal charge amplification occurs in such an electromechanical capacitor resulting in a negative capacitance. The first consequence of this amplification is a boost in the on-current of the transistor. As a second consequence, employing the Lagrangian method, we find that by using the negative capacitance of a highly compliant piezoelectric barrier, one can potentially reduce the subthreshold slope of a transistor below the room temperature Boltzmann limit of 60 mV/decade. However, this may come at the cost of hysteretic behavior in the transfer characteristics.
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Submitted 2 May, 2015;
originally announced May 2015.
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A Surface-Potential Based Compact Model for GaN HEMTs Directly Incorporating Polarization Charges
Authors:
Raj K. Jana,
Huili,
Xing,
Debdeep Jena
Abstract:
A method to incorporate polarization charges at heterojunctions in compact models for transistors is presented. By including the polarization sheet charge as a Dirac delta function, the Poisson equation is solved to yield a closed equation for the surface potential. A compact model for transistors based on the surface potential incorporating polarization charges describes the on-state as well as t…
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A method to incorporate polarization charges at heterojunctions in compact models for transistors is presented. By including the polarization sheet charge as a Dirac delta function, the Poisson equation is solved to yield a closed equation for the surface potential. A compact model for transistors based on the surface potential incorporating polarization charges describes the on-state as well as the off-state regimes of device operation. The new method of incorporating polarization charges in compact models helps make a direct connection to the material properties of the transistor. The current-voltage (I-V) curves generated by this model are in good agreement with the experimental data for GaN HEMTs.
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Submitted 7 February, 2013; v1 submitted 5 February, 2013;
originally announced February 2013.
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Stark-Effect Scattering in Rough Quantum Wells
Authors:
Raj K. Jana,
Debdeep Jena
Abstract:
A scattering mechanism stemming from the Stark-shift of energy levels by electric fields in semiconductor quantum wells is identified. This scattering mechanism feeds off interface roughness and electric fields, and modifies the well known 'sixth-power' law of electron mobility degradation. This work first treats Stark-effect scattering in rough quantum wells as a perturbation for small electric f…
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A scattering mechanism stemming from the Stark-shift of energy levels by electric fields in semiconductor quantum wells is identified. This scattering mechanism feeds off interface roughness and electric fields, and modifies the well known 'sixth-power' law of electron mobility degradation. This work first treats Stark-effect scattering in rough quantum wells as a perturbation for small electric fields, and then directly absorbs it into the Hamiltonian for large fields. The major result is the existence of a window of quantum well widths for which the combined roughness scattering is minimum. Carrier scattering and mobility degradation in wide quantum wells are thus expected to be equally severe as in narrow wells due to Stark-effect scattering in electric fields.
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Submitted 20 May, 2011;
originally announced May 2011.
