Showing 1–3 of 3 results for author: Ecker, W

The Argument for Meta-Modeling-Based Approaches to Hardware Generation Languages

Authors: Johannes Schreiner, Daniel Gerl, Robert Kunzelmann, Paritosh Kumar Sinha, Wolfgang Ecker

Abstract: The rapid evolution of Integrated Circuit (IC) development necessitates innovative methodologies such as code generation to manage complexity and increase productivity. Using the right methodology for generator development to maximize the capability and, most notably, the feasibility of generators is a crucial part of this work. Meta-Modeling-based approaches drawing on the principles of Model Dri… ▽ More The rapid evolution of Integrated Circuit (IC) development necessitates innovative methodologies such as code generation to manage complexity and increase productivity. Using the right methodology for generator development to maximize the capability and, most notably, the feasibility of generators is a crucial part of this work. Meta-Modeling-based approaches drawing on the principles of Model Driven Architecture (MDA) are a promising methodology for generator development. The goal of this paper is to show why such an MDA-based approach can provide extremely powerful generators with minimal implementation effort and to demonstrate that this approach is a superior alternative to the most advanced hardware generation languages such as SpinalHDL and Chisel. For this purpose, this paper provides an in-depth comparison of the Meta-Modeling approach against these hardware generation languages, highlighting the unique advantages of a Meta-Modeling-based approach and summarizes the benefits. △ Less

Submitted 8 April, 2024; originally announced April 2024.

MetFI: Model-driven Fault Simulation Framework

Authors: Endri Kaja, Nicolas Gerlin, Luis Rivas, Monideep Bora, Keerthikumara Devarajegowda, Wolfgang Ecker

Abstract: Safety-critical designs need to ensure reliable operations under hostile conditions with a certain degree of confidence. The continuously higher complexity of these designs makes them more susceptible to the risk of failure. ISO26262 recommends fault injection as the proper technique to verify and measure the dependability of safety-critical designs. To cope with the complexity, a lot of effort an… ▽ More Safety-critical designs need to ensure reliable operations under hostile conditions with a certain degree of confidence. The continuously higher complexity of these designs makes them more susceptible to the risk of failure. ISO26262 recommends fault injection as the proper technique to verify and measure the dependability of safety-critical designs. To cope with the complexity, a lot of effort and stringent verification flow is needed. Moreover, many fault injection tools offer only a limited degree of controllability. We propose MetaFI, a model-driven simulator-independent fault simulation framework that provides multi-purpose fault injection strategies such as Statistical Fault Injection, Direct Fault Injection, Exhaustive Fault Injection, and at the same time reduces manual efforts. The framework enables injection of Stuck-at faults, Single-Event Transient faults, Single-Event Upset faults as well as Timing faults. The fault simulation is performed at the Register Transfer Level (RTL) of a design, in which parts of the design targeted for fault simulation are represented with Gate-level (GL) granularity. MetaFI is scalable with a full System-on-Chip (SoC) design and to demonstrate the applicability of the framework, fault simulation was applied to various components of two different SoCs. One SoC is running the Dhrystone application and the other one is running a Fingerprint calculation application. A minimal effort of 2 persondays was required to run 38 various fault injection campaigns on both the designs. The framework provided significant data regarding failure rates of the components. Results concluded that Prefetcher, a component of the SoC processor, is more susceptible to failures than the other targeted components on both the SoCs, regardless of the running application. △ Less

Submitted 27 April, 2022; originally announced April 2022.

Symbolic QED Pre-silicon Verification for Automotive Microcontroller Cores: Industrial Case Study

Authors: Eshan Singh, Keerthikumara Devarajegowda, Sebastian Simon, Ralf Schnieder, Karthik Ganesan, Mohammad R. Fadiheh, Dominik Stoffel, Wolfgang Kunz, Clark Barrett, Wolfgang Ecker, Subhasish Mitra

Abstract: We present an industrial case study that demonstrates the practicality and effectiveness of Symbolic Quick Error Detection (Symbolic QED) in detecting logic design flaws (logic bugs) during pre-silicon verification. Our study focuses on several microcontroller core designs (~1,800 flip-flops, ~70,000 logic gates) that have been extensively verified using an industrial verification flow and used fo… ▽ More We present an industrial case study that demonstrates the practicality and effectiveness of Symbolic Quick Error Detection (Symbolic QED) in detecting logic design flaws (logic bugs) during pre-silicon verification. Our study focuses on several microcontroller core designs (~1,800 flip-flops, ~70,000 logic gates) that have been extensively verified using an industrial verification flow and used for various commercial automotive products. The results of our study are as follows: 1. Symbolic QED detected all logic bugs in the designs that were detected by the industrial verification flow (which includes various flavors of simulation-based verification and formal verification). 2. Symbolic QED detected additional logic bugs that were not recorded as detected by the industrial verification flow. (These additional bugs were also perhaps detected by the industrial verification flow.) 3. Symbolic QED enables significant design productivity improvements: (a) 8X improved (i.e., reduced) verification effort for a new design (8 person-weeks for Symbolic QED vs. 17 person-months using the industrial verification flow). (b) 60X improved verification effort for subsequent designs (2 person-days for Symbolic QED vs. 4-7 person-months using the industrial verification flow). (c) Quick bug detection (runtime of 20 seconds or less), together with short counterexamples (10 or fewer instructions) for quick debug, using Symbolic QED. △ Less

Submitted 4 February, 2019; originally announced February 2019.