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Semi-Supervised Health Index Monitoring with Feature Generation and Fusion
Authors:
Gaëtan Frusque,
Ismail Nejjar,
Majid Nabavi,
Olga Fink
Abstract:
The Health Index (HI) is crucial for evaluating system health, aiding tasks like anomaly detection and predicting remaining useful life for systems demanding high safety and reliability. Tight monitoring is crucial for achieving high precision at a lower cost. Obtaining HI labels in real-world applications is often cost-prohibitive, requiring continuous, precise health measurements. Therefore, it…
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The Health Index (HI) is crucial for evaluating system health, aiding tasks like anomaly detection and predicting remaining useful life for systems demanding high safety and reliability. Tight monitoring is crucial for achieving high precision at a lower cost. Obtaining HI labels in real-world applications is often cost-prohibitive, requiring continuous, precise health measurements. Therefore, it is more convenient to leverage run-to failure datasets that may provide potential indications of machine wear condition, making it necessary to apply semi-supervised tools for HI construction. In this study, we adapt the Deep Semi-supervised Anomaly Detection (DeepSAD) method for HI construction. We use the DeepSAD embedding as a condition indicators to address interpretability challenges and sensitivity to system-specific factors. Then, we introduce a diversity loss to enrich condition indicators. We employ an alternating projection algorithm with isotonic constraints to transform the DeepSAD embedding into a normalized HI with an increasing trend. Validation on the PHME 2010 milling dataset, a recognized benchmark with ground truth HIs demonstrates meaningful HIs estimations. Our contributions create opportunities for more accessible and reliable HI estimation, particularly in cases where obtaining ground truth HI labels is unfeasible.
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Submitted 16 February, 2024; v1 submitted 5 December, 2023;
originally announced December 2023.
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Advanced Manufacturing Configuration by Sample-efficient Batch Bayesian Optimization
Authors:
Xavier Guidetti,
Alisa Rupenyan,
Lutz Fassl,
Majid Nabavi,
John Lygeros
Abstract:
We propose a framework for the configuration and operation of expensive-to-evaluate advanced manufacturing methods, based on Bayesian optimization. The framework unifies a tailored acquisition function, a parallel acquisition procedure, and the integration of process information providing context to the optimization procedure. \cmtb{The novel acquisition function is demonstrated, analyzed and comp…
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We propose a framework for the configuration and operation of expensive-to-evaluate advanced manufacturing methods, based on Bayesian optimization. The framework unifies a tailored acquisition function, a parallel acquisition procedure, and the integration of process information providing context to the optimization procedure. \cmtb{The novel acquisition function is demonstrated, analyzed and compared on state-of-the-art benchmarking problems. We apply the optimization approach to atmospheric plasma spraying and fused deposition modeling.} Our results demonstrate that the proposed framework can efficiently find input parameters that produce the desired outcome and minimize the process cost.
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Submitted 12 September, 2022; v1 submitted 24 May, 2022;
originally announced May 2022.
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Plasma Spray Process Parameters Configuration using Sample-efficient Batch Bayesian Optimization
Authors:
Xavier Guidetti,
Alisa Rupenyan,
Lutz Fassl,
Majid Nabavi,
John Lygeros
Abstract:
Recent work has shown constrained Bayesian optimization to be a powerful technique for the optimization of industrial processes. In complex manufacturing processes, the possibility to run extensive sequences of experiments with the goal of finding good process parameters is severely limited by the time required for quality evaluation of the produced parts. To accelerate the process parameter optim…
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Recent work has shown constrained Bayesian optimization to be a powerful technique for the optimization of industrial processes. In complex manufacturing processes, the possibility to run extensive sequences of experiments with the goal of finding good process parameters is severely limited by the time required for quality evaluation of the produced parts. To accelerate the process parameter optimization, we introduce a parallel acquisition procedure tailored on the process characteristics. We further propose an algorithm that adapts to equipment status to improve run-to-run reproducibility. We validate our optimization method numerically and experimentally, and demonstrate that it can efficiently find input parameters that produce the desired outcome and minimize the process cost.
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Submitted 11 May, 2022; v1 submitted 25 March, 2021;
originally announced March 2021.
