AI-assisted Automated Workflow for Real-time X-ray Ptychography Data Analysis via Federated Resources
Authors:
Anakha V Babu,
Tekin Bicer,
Saugat Kandel,
Tao Zhou,
Daniel J. Ching,
Steven Henke,
Siniša Veseli,
Ryan Chard,
Antonino Miceli,
Mathew Joseph Cherukara
Abstract:
We present an end-to-end automated workflow that uses large-scale remote compute resources and an embedded GPU platform at the edge to enable AI/ML-accelerated real-time analysis of data collected for x-ray ptychography. Ptychography is a lensless method that is being used to image samples through a simultaneous numerical inversion of a large number of diffraction patterns from adjacent overlappin…
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We present an end-to-end automated workflow that uses large-scale remote compute resources and an embedded GPU platform at the edge to enable AI/ML-accelerated real-time analysis of data collected for x-ray ptychography. Ptychography is a lensless method that is being used to image samples through a simultaneous numerical inversion of a large number of diffraction patterns from adjacent overlapping scan positions. This acquisition method can enable nanoscale imaging with x-rays and electrons, but this often requires very large experimental datasets and commensurately high turnaround times, which can limit experimental capabilities such as real-time experimental steering and low-latency monitoring. In this work, we introduce a software system that can automate ptychography data analysis tasks. We accelerate the data analysis pipeline by using a modified version of PtychoNN -- an ML-based approach to solve phase retrieval problem that shows two orders of magnitude speedup compared to traditional iterative methods. Further, our system coordinates and overlaps different data analysis tasks to minimize synchronization overhead between different stages of the workflow. We evaluate our workflow system with real-world experimental workloads from the 26ID beamline at Advanced Photon Source and ThetaGPU cluster at Argonne Leadership Computing Resources.
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Submitted 9 April, 2023;
originally announced April 2023.
Deep learning at the edge enables real-time streaming ptychographic imaging
Authors:
Anakha V Babu,
Tao Zhou,
Saugat Kandel,
Tekin Bicer,
Zhengchun Liu,
William Judge,
Daniel J. Ching,
Yi Jiang,
Sinisa Veseli,
Steven Henke,
Ryan Chard,
Yudong Yao,
Ekaterina Sirazitdinova,
Geetika Gupta,
Martin V. Holt,
Ian T. Foster,
Antonino Miceli,
Mathew J. Cherukara
Abstract:
Coherent microscopy techniques provide an unparalleled multi-scale view of materials across scientific and technological fields, from structural materials to quantum devices, from integrated circuits to biological cells. Driven by the construction of brighter sources and high-rate detectors, coherent X-ray microscopy methods like ptychography are poised to revolutionize nanoscale materials charact…
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Coherent microscopy techniques provide an unparalleled multi-scale view of materials across scientific and technological fields, from structural materials to quantum devices, from integrated circuits to biological cells. Driven by the construction of brighter sources and high-rate detectors, coherent X-ray microscopy methods like ptychography are poised to revolutionize nanoscale materials characterization. However, associated significant increases in data and compute needs mean that conventional approaches no longer suffice for recovering sample images in real-time from high-speed coherent imaging experiments. Here, we demonstrate a workflow that leverages artificial intelligence at the edge and high-performance computing to enable real-time inversion on X-ray ptychography data streamed directly from a detector at up to 2 kHz. The proposed AI-enabled workflow eliminates the sampling constraints imposed by traditional ptychography, allowing low dose imaging using orders of magnitude less data than required by traditional methods.
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Submitted 19 September, 2022;
originally announced September 2022.
