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Thomas M. Storey

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2000 – 2009

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2004
[c8]
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Thomas M. Storey:
Testing in a high volume DSM Environment. ITC 2004: 1422
2003
[c7]
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Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey:
Deformations of IC Structure in Test and Yield Learning. ITC 2003: 856-865

1990 – 1999

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1997
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Thomas M. Storey, Bruce McWilliam:
A Test Methodology for High Performance MCMs. J. Electron. Test. 10(1-2): 109-118 (1997)
1994
[c6]
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Thomas M. Storey, C. Lapihuska, E. Atwood, L. Su:
A Test Methodology to Support an ASEM MCM Foundry. ITC 1994: 426-435
1993
[c5]
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Thomas M. Storey:
A Test Methodology for VLSI Chips on Silicon. ITC 1993: 359-368
1991
[c4]
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Thomas M. Storey, Wojciech Maly, John Andrews, Myron Miske:
Stuck Fault and Current Testing Comparison Using CMOS Chip Test. ITC 1991: 311-318
1990
[c3]
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Thomas M. Storey, Wojciech Maly:
CMOS bridging fault detection. ITC 1990: 842-851
[c2]
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Thomas M. Storey, Wojciech Maly:
CMOS Bridging Fault Detection. ITC 1990: 1123-1132

1970 – 1979

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1977
[c1]
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Thomas M. Storey, J. W. Barry:
Delay test simulation. DAC 1977: 492-494

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