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"Data retention statistics and modelling in HfO2 resistive switching memories."
Stefano Ambrogio et al. (2015)
- Stefano Ambrogio, Simone Balatti, Zhongqiang Wang, Yu-Sheng Chen, Heng-Yuan Lee, Frederick T. Chen, Daniele Ielmini:
Data retention statistics and modelling in HfO2 resistive switching memories. IRPS 2015: 7
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