The results of an extensive study of the probability of damage induced in implant quality intraocular lenses (IOLs) by a commercially available nanosecond Nd:YAG photodisruptor are presented. These results were compared with the morphology of damage seen on scanning electron microscopy. The differences in the shape of the damage probability curves derived for the different lens groups demonstrate that a single threshold value does not characterize the threshold for IOL damage. We suggest that a standard method using a clinical photodisruptor be used by all workers to derive these curves for all IOLs in clinical use. The clinical relevance of our findings is emphasized.