Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization

M Lanza; A Bayerl; T Gao; M Porti; M Nafria; G Y Jing; Y F Zhang; Z F Liu; H L Duan

doi:10.1002/adma.201204380

Graphene-coated atomic force microscope tips for reliable nanoscale electrical characterization

Adv Mater. 2013 Mar 13;25(10):1440-4. doi: 10.1002/adma.201204380. Epub 2012 Dec 27.

Authors

M Lanza¹, A Bayerl, T Gao, M Porti, M Nafria, G Y Jing, Y F Zhang, Z F Liu, H L Duan

Affiliation

¹ State Key Laboratory for Turbulence and Complex System, Department of Mechanics and Aerospace Engineering, CAPT, College of Engineering, Peking University, Beijing 100871, China.

PMID: 23280635
DOI: 10.1002/adma.201204380

Abstract

Graphene single-layer films are grown by chemical vapor deposition and transferred onto commercially available conductive tips for atomic force microscopy. Graphene-coated tips are much more resistant to both high currents and frictions than commercially available, metal-varnished, conductive atomic force microscopy tips, leading to much larger lifetimes and more reliable imaging due to a lower tip-sample interaction.

Publication types

Research Support, Non-U.S. Gov't

MeSH terms

Electricity
Graphite / chemistry*
Microscopy, Atomic Force
Nanotechnology
Polymethyl Methacrylate / chemistry

Substances

Graphite
Polymethyl Methacrylate