Determination of X-ray detection limit and applications in perovskite X-ray detectors

Lei Pan; Shreetu Shrestha; Neil Taylor; Wanyi Nie; Lei R Cao

doi:10.1038/s41467-021-25648-7

Determination of X-ray detection limit and applications in perovskite X-ray detectors

Nat Commun. 2021 Sep 6;12(1):5258. doi: 10.1038/s41467-021-25648-7.

Authors

Lei Pan¹, Shreetu Shrestha², Neil Taylor¹, Wanyi Nie², Lei R Cao³

Affiliations

¹ Nuclear Engineering Program, Department of Mechanical and Aerospace Engineering, The Ohio State University, Columbus, OH, USA.
² Center for Integrated Nanotechnology Materials Physics and Application Division, Los Alamos National Laboratory, Los Alamos, NM, USA.
³ Nuclear Engineering Program, Department of Mechanical and Aerospace Engineering, The Ohio State University, Columbus, OH, USA. [email protected].

Abstract

X-ray detection limit and sensitivity are important figure of merits for perovskite X-ray detectors, but literatures lack a valid mathematic expression for determining the lower limit of detection for a perovskite X-ray detector. In this work, we present a thorough analysis and new method for X-ray detection limit determination based on a statistical model that correlates the dark current and the X-ray induced photocurrent with the detection limit. The detection limit can be calculated through the measurement of dark current and sensitivity with an easy-to-follow practice. Alternatively, the detection limit may also be obtained by the measurement of dark current and photocurrent when repeatedly lowering the X-ray dose rate. While the material quality is critical, we show that the device architecture and working mode also have a significant influence on the sensitivity and the detection limit. Our work establishes a fair comparison metrics for material and detector development.

Abstract

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