Bimodal interferences of Pb(II) induced by parallel deposition in Pb(II)-Cu(II) electrochemical detections: Voltammetric signals analysis combined with numerical simulations on transient interfacial phenomena

Rui-Ze Xia; Xin Cai; Bo Liang; Hai-Hua Dai; Yang-Zhi Liu; Meng Yang; Shi-Hua Chen; Pei-Hua Li; Xing-Jiu Huang

doi:10.1016/j.jhazmat.2023.132104

Bimodal interferences of Pb(II) induced by parallel deposition in Pb(II)-Cu(II) electrochemical detections: Voltammetric signals analysis combined with numerical simulations on transient interfacial phenomena

J Hazard Mater. 2023 Oct 5:459:132104. doi: 10.1016/j.jhazmat.2023.132104. Epub 2023 Jul 20.

Authors

Rui-Ze Xia¹, Xin Cai², Bo Liang², Hai-Hua Dai², Yang-Zhi Liu², Meng Yang³, Shi-Hua Chen⁴, Pei-Hua Li⁵, Xing-Jiu Huang⁶

Affiliations

¹ Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China; Key Laboratory of Environmental Optics and Technology, And Environmental Materials and Pollution Control Laboratory, Institute of Solid State Physics, HFIPS, Chinese Academy of Sciences, Hefei 230031, China; Institutes of Physical Science and Information Technology, Anhui University, Hefei 230601, China.
² Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China; Key Laboratory of Environmental Optics and Technology, And Environmental Materials and Pollution Control Laboratory, Institute of Solid State Physics, HFIPS, Chinese Academy of Sciences, Hefei 230031, China.
³ Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China; Key Laboratory of Environmental Optics and Technology, And Environmental Materials and Pollution Control Laboratory, Institute of Solid State Physics, HFIPS, Chinese Academy of Sciences, Hefei 230031, China. Electronic address: [email protected].
⁴ Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China; Key Laboratory of Environmental Optics and Technology, And Environmental Materials and Pollution Control Laboratory, Institute of Solid State Physics, HFIPS, Chinese Academy of Sciences, Hefei 230031, China. Electronic address: [email protected].
⁵ Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China; Key Laboratory of Environmental Optics and Technology, And Environmental Materials and Pollution Control Laboratory, Institute of Solid State Physics, HFIPS, Chinese Academy of Sciences, Hefei 230031, China. Electronic address: [email protected].
⁶ Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, China; Key Laboratory of Environmental Optics and Technology, And Environmental Materials and Pollution Control Laboratory, Institute of Solid State Physics, HFIPS, Chinese Academy of Sciences, Hefei 230031, China; Institutes of Physical Science and Information Technology, Anhui University, Hefei 230601, China. Electronic address: [email protected].

PMID: 37490798
DOI: 10.1016/j.jhazmat.2023.132104

Abstract

The perplexity of double peaks in Pb(II) detections has been a threat to the reliability of Pb(II) electroanalysis results for a long term. For the complexity of electrode interfaces, rare studies were taken on mechanisms of Pb(II) double peaks through interfacial kinetics. In this work, analyses on experimental signals and interfacial simulations were working together to reveal that the generation of Pb(II) double peaks in Pb(II)-Cu(II) systems is the deposition of Pb(II) on Cu deposits occurring in parallel. By applying anode stripping voltammetry and cyclic voltammetry, a parallel deposition reaction was found to influence the shape of Pb(II) peaks, and the existence of the second peak was controlled through the adjustment of experimental conditions. A kinetic model was built to reveal the interference of electroanalysis signals caused by a parallel deposition reaction and simulations based on the model were combined with experiments to illustrate that double peaks of Pb(II) were caused by the parallel deposition on Cu(II) deposits. This work proposes another insight of Pb(II) double peaks from macroscale kinetics and pays more attention on the dynamic procedure of electroanalysis interfaces, which makes the study on environmental electroanalysis interface phenomena more clear and is enlightening to develop efficient electrical methods for pollutant monitoring.

Keywords: Double peaks interferences; Lead; Numerical simulation; Transient phenomena; Voltammetric analysis.