The Failure Mechanism of Micro Thermoelectric Devices under the Action of the Temperature Field.
Lyu J, Yang D, Liu Y, Li J, Zhang Z, Li Z, Liu M, Liu W, Ren Z, Liu H, Wu J, Tang X, Yan Y.
Lyu J, et al. Among authors: liu y, liu h, liu m, liu w.
ACS Appl Mater Interfaces. 2024 Apr 3;16(13):16505-16514. doi: 10.1021/acsami.4c00625. Epub 2024 Mar 25.
ACS Appl Mater Interfaces. 2024.
PMID: 38527233