AC metrology applications of the Josephson effect.
Benz SP, Biesecker J, Burroughs CJ, Castellanos-Beltran MA, Dresselhaus PD, Flowers-Jacobs NE, Fox AE, Hopkins PF, Johnson-Wilke R, Olaya D, Rüfenacht A, Sirois AJ, Thomas JN.
Benz SP, et al. Among authors: fox ae.
Appl Phys Lett. 2024;125(5):10.1063/5.0219991. doi: 10.1063/5.0219991.
Appl Phys Lett. 2024.
PMID: 39534018
Free PMC article.