Hanle Effect for Lifetime Determinations in the Soft X-Ray Regime.
Togawa M, Richter J, Shah C, Botz M, Nenninger J, Danisch J, Goes J, Kühn S, Amaro P, Mohamed A, Amano Y, Orlando S, Totani R, de Simone M, Fritzsche S, Pfeifer T, Coreno M, Surzhykov A, López-Urrutia JRC.
Togawa M, et al. Among authors: richter j.
Phys Rev Lett. 2024 Oct 18;133(16):163202. doi: 10.1103/PhysRevLett.133.163202.
Phys Rev Lett. 2024.
PMID: 39485972