On High-Quality Test Pattern Selection and Manipulation
With a given test set, this paper is concerned about selecting a subset of test patterns and
manipulating them into high-quality ones that reduce both under-testing and over-testing,
which are both serious concerns for the semiconductor industry with technology scaling.
Experimental results on IWLS'05 benchmark demonstrate the effectiveness of the proposed
solution.
manipulating them into high-quality ones that reduce both under-testing and over-testing,
which are both serious concerns for the semiconductor industry with technology scaling.
Experimental results on IWLS'05 benchmark demonstrate the effectiveness of the proposed
solution.
With a given test set, this paper is concerned about selecting a subset of test patterns and manipulating them into high-quality ones that reduce both under-testing and over-testing, which are both serious concerns for the semiconductor industry with technology scaling. Experimental results on IWLS'05 benchmark demonstrate the effectiveness of the proposed solution.
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