Computer Science > Computer Vision and Pattern Recognition
[Submitted on 29 Jun 2023 (v1), last revised 10 Jul 2023 (this version, v2)]
Title:Metric-aligned Sample Selection and Critical Feature Sampling for Oriented Object Detection
View PDFAbstract:Arbitrary-oriented object detection is a relatively emerging but challenging task. Although remarkable progress has been made, there still remain many unsolved issues due to the large diversity of patterns in orientation, scale, aspect ratio, and visual appearance of objects in aerial images. Most of the existing methods adopt a coarse-grained fixed label assignment strategy and suffer from the inconsistency between the classification score and localization accuracy. First, to align the metric inconsistency between sample selection and regression loss calculation caused by fixed IoU strategy, we introduce affine transformation to evaluate the quality of samples and propose a distance-based label assignment strategy. The proposed metric-aligned selection (MAS) strategy can dynamically select samples according to the shape and rotation characteristic of objects. Second, to further address the inconsistency between classification and localization, we propose a critical feature sampling (CFS) module, which performs localization refinement on the sampling location for classification task to extract critical features accurately. Third, we present a scale-controlled smooth $L_1$ loss (SC-Loss) to adaptively select high quality samples by changing the form of regression loss function based on the statistics of proposals during training. Extensive experiments are conducted on four challenging rotated object detection datasets DOTA, FAIR1M-1.0, HRSC2016, and UCAS-AOD. The results show the state-of-the-art accuracy of the proposed detector.
Submission history
From: Peng Sun [view email][v1] Thu, 29 Jun 2023 06:36:46 UTC (3,630 KB)
[v2] Mon, 10 Jul 2023 07:16:17 UTC (4,103 KB)
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