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"Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing."
Lizhou Wu et al. (2019)
- Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar:
Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. ETS 2019: 1-6
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